Microscopy in solid state science

A. J. McGibbon*, L. M. Brown, A. L. Bleloch, N. D. Browning, F. Cadete Santos Aires, P. J. Fallon, P. H. Gaskell, K. W.R. Gilkes, P. L. Hansen, A. Howie, A. D. Maynard, D. W. McComb, D. McMullan, H. Mllejans, Y. Murooka, J. H. Paterson, D. D. Perovic, W. T. Pike, I. A. Rauf, J. M. RodenburgA. Saeed, N. Stelmashenko, King-Ning Tu, M. G. Walls, C. A. Walsh, J. Yuan, J. Zhao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


The Microstructural Physics group at the Cavendish Laboratory is actively involved in a considerable number of research projects which cover a broad range of materials science. In this paper, we describe briefly several such projects, with particular emphasis given to the application of paralleldetection electron energy loss spectroscopy (PEELS) on a scanning transmission electron microscope (STEM) to the analysis of materials such as stainless steels, catalysts, and high temperature superconductors. In addition, we describe a number of related projects that are currently being carried out in the group, particularly those which utilise and develop novel STEM imaging and analytical techniques.1993 WileyLiss, Inc. Copyright1993 WileyLiss, Inc.

Original languageEnglish
Pages (from-to)299-315
Number of pages17
JournalMicroscopy Research and Technique
Issue number4
StatePublished - 1 Jan 1993


  • Nanolithography
  • STEM
  • STM
  • Superresolution

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