Message from the general chairs

Wei Hwang*, Cheng Wen Wu

*Corresponding author for this work

Research output: Contribution to journalEditorial

Original languageEnglish
Article number4547600
JournalRecords of the IEEE International Workshop on Memory Technology, Design and Testing
DOIs
StatePublished - 1 Dec 2007
Event17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 - Taipei, Taiwan
Duration: 3 Dec 20075 Dec 2007

Cite this