Mental map preserving graph drawing using simulated annealing

Yi Yi Lee, Chun-Cheng Lin, Hsu Chun Yen*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

27 Scopus citations

Abstract

Information visualization has attracted much attention in recent years in many fields of science and engineering. In many applications, graphs are 'dynamic' in the sense that changes are constantly applied to a graph to reflect the evolution of the system behaviour represented by the graph. In the past, the concept of the so-called "mental map" has largely been ignored. Users often have to spend a lot of time relearning the redrawn graphs. This paper proposes an effective way to release the user from such kind of a distasteful job by maintaining a high degree of the "mental map" for general graphs when graphs are redrawn. Our experimental results suggest this new approach to be promising. .

Original languageEnglish
Title of host publicationInformation Visualisation 2006 - Asia Pacific Symposium on Information Visualisation, APVIS 2006
Pages179-188
Number of pages10
StatePublished - 1 Dec 2006
EventAsia Pacific Symposium on Information Visualisation, APVIS 2006 - Tokyo, Japan
Duration: 1 Feb 20063 Feb 2006

Publication series

NameConferences in Research and Practice in Information Technology Series
Volume60
ISSN (Print)1445-1336

Conference

ConferenceAsia Pacific Symposium on Information Visualisation, APVIS 2006
CountryJapan
CityTokyo
Period1/02/063/02/06

Keywords

  • Graph drawing
  • Mental map
  • Simulated annealing

Fingerprint Dive into the research topics of 'Mental map preserving graph drawing using simulated annealing'. Together they form a unique fingerprint.

  • Cite this

    Lee, Y. Y., Lin, C-C., & Yen, H. C. (2006). Mental map preserving graph drawing using simulated annealing. In Information Visualisation 2006 - Asia Pacific Symposium on Information Visualisation, APVIS 2006 (pp. 179-188). (Conferences in Research and Practice in Information Technology Series; Vol. 60).