Mechanisms of Interface Trap-Induced Drair Leakage Current in Off-State n-MOSFET's

Tse En Chang, Ta-Hui Wang, Chimoon Huang

Research output: Contribution to journalArticle

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Abstract

An interface trap-assisted tunneling and thermionic emission model has been developed to study an increased drain leakage current in off-state n-MOSFET's after hot carrier stress. In the model, a complete band-trap-band leakage path is formed at the Si/Si02 interface by hole emission from interface traps to a valence band and electron emission from interface traps to a conduction band. Both hole and electron emissions are carried out via quantum tunneling or thermal excitation. In this experiment, a 0.5 µm n-MOSFET was subjected to a dc voltage stress to generate interface traps. The drain leakage current was characterized to compare with the model. Our study reveals that the interface trap-assisted two-step tunneling, hole tunneling followed by electron tunneling, holds responsible for the leakage current at a large drain-to-gate bias (V dg). The lateral field plays a major role in the two-step tunneling process. The additional drain leakage current due to band - trap-band tunneling is adequately described by an analytical expression ΔId=A exp(Bit/F). The value of Bit about 13 mV/cm was obtained in a stressed MOSFET, which is significantly lower than in the GIDL current attributed to direct band-to-band tunneling. As V dg decreases, a thermionic-field emission mechanism, hole thermionic emission and electron tunneling, becomes a primary leakage path. At a sufficiently low V dg’ our model reduces to the Shockley–Read–Hall theory and thermal generation of electron-hole pairs through traps is dominant.

Original languageEnglish
Pages (from-to)738-743
Number of pages6
JournalIEEE Transactions on Electron Devices
Volume42
Issue number4
DOIs
StatePublished - 1 Jan 1995

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