Mechanism for photon emission from Au nano-hemispheres induced by scanning tunneling microscopy

Ian Liau, Norbert F. Scherer*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

The photon emission yield observed in scanning tunneling microscopy (STM) measurements of Au hemispheroid-decorated thin films is used to elucidate the interaction of tunneling electrons with local surface plasmon modes. The photon emission probability is found to depend on the surface feature size. The agreement of a model calculation with the experimental results demonstrates that inelastic electron tunneling is the dominant mechanism of STM-induced plasmon excitation for 10-60 nm size metallic features.

Original languageEnglish
Pages (from-to)3966-3968
Number of pages3
JournalApplied Physics Letters
Volume74
Issue number26
DOIs
StatePublished - 28 Jun 1999

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