Measuring the thickness of transparent objects using a confocal displacement sensor

Chun Jen Weng, Bo Rong Lu, Pi-Ying Cheng, Chi Hung Hwang, Chih Yen Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

This paper reports on a confocal displacement sensor with varifocal lens used to measure the thickness of transparent materials. The focal length of the varifocal lens is adjusted by varying the current. Laser light passing through a transparent target lying within the range of the focal length crosses two interfaces; i.e., first from air to glass and then from glass to air. The signals associated with the interface were of higher intensity than that measure at other points along the z axis. A power meter is used to measure the power and LabVIEW is used to record a power-current graph. The current gap between the two peaks can be translated into values of displacement, indicating the thickness of the material.

Original languageEnglish
Title of host publicationI2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509035960
DOIs
StatePublished - 5 Jul 2017
Event2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017 - Torino, Italy
Duration: 22 May 201725 May 2017

Publication series

NameI2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings

Conference

Conference2017 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017
CountryItaly
CityTorino
Period22/05/1725/05/17

Keywords

  • Confocal
  • Thickness
  • Varifocal lens

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    Weng, C. J., Lu, B. R., Cheng, P-Y., Hwang, C. H., & Chen, C. Y. (2017). Measuring the thickness of transparent objects using a confocal displacement sensor. In I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings [7969897] (I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/I2MTC.2017.7969897