Measuring the Edge Recombination Velocity of Monolayer Semiconductors

Peida Zhao, Matin Amani, Der Hsien Lien, Geun Ho Ahn, Daisuke Kiriya, James P. Mastandrea, Joel W. Ager, Eli Yablonovitch, Daryl C. Chrzan, Ali Javey*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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