Measuring the edge recombination velocity of monolayer semiconductors

Peida Zhao, Matin Amani, Der Hsien Lien, Geun Ho Ahn, Daisuke Kiriya, James P. Mastandrea, Joel W. Ager, Eli Yablonovitch, Daryl C. Chrzan, Ali Javey

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Chemical Compounds

Engineering & Materials Science