Measuring production yield for processes with multiple quality characteristics

W.l. Pearn, F. K. Wang*, C. H. Yen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Scopus citations

Abstract

Process yield is an important criterion used in the manufacturing industry for measuring process performance. Methods for measuring yield for processes with single characteristic have been investigated extensively. However, methods for measuring yield for processes with multiple characteristics have been comparatively neglected. In this paper, we develop a generalized yield index, called TSpk,PC, based on the index Spk introduced by Boyles (Journal of Quality Technology, 23, 17-26, 1991) using the principal component analysis (PCA) technique. We obtained a lower confidence bound (LCB) for the true process yield. The proposed method can be used to determine whether a process meets the preset yield requirement, and make reliable decisions. Examples are provided to demonstrate the proposed methodology.

Original languageEnglish
Pages (from-to)4649-4661
Number of pages13
JournalInternational Journal of Production Research
Volume44
Issue number21
DOIs
StatePublished - 1 Nov 2006

Keywords

  • Lower confidence bound
  • Principal component analysis
  • Process capability indices
  • Process yield

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