We use the optical pickup head of a commercial compact disk (CD)/digital versatile disk (DVD) read only memory (ROM) drive to detect the vertical displacement of micro fabricated cantilever in atomic force microscopy (AFM). Both the contact and AC modes of AFM are demonstrated. The single atomic steps of graphite can be resolved, indicating that atomic resolution in the vertical displacement detection can be achieved with this new setup. The low cost, compact size, and the light weight of CD/DVD optical pickups may offer new advantages in future AFM designs.
|Number of pages||4|
|Journal||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|Issue number||3 B|
|State||Published - 27 Mar 2006|