Measurement of cantilever displacement using a compact disk/digital versatile disk pickup head

En Te Hwu, Kuang Yuh Huang, Shao-Kang Hung, Ing Shouh Hwang*

*Corresponding author for this work

Research output: Contribution to journalArticle

47 Scopus citations

Abstract

We use the optical pickup head of a commercial compact disk (CD)/digital versatile disk (DVD) read only memory (ROM) drive to detect the vertical displacement of micro fabricated cantilever in atomic force microscopy (AFM). Both the contact and AC modes of AFM are demonstrated. The single atomic steps of graphite can be resolved, indicating that atomic resolution in the vertical displacement detection can be achieved with this new setup. The low cost, compact size, and the light weight of CD/DVD optical pickups may offer new advantages in future AFM designs.

Original languageEnglish
Pages (from-to)2368-2371
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume45
Issue number3 B
DOIs
StatePublished - 27 Mar 2006

Keywords

  • AFM
  • Cantilever
  • CD
  • DVD

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