Mathematical yield estimation for two-dimensional-redundancy memory arrays

Chia-Tso Chao, Ching Yu Chin, Chen Wei Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Defect repair has become a necessary process to enhance the overall yield for memories since manufacturing a natural good memory is difficult in current memory technologies. This paper presents an yield-estimation scheme, which utilizes an inductionbased approach to calculate the probability that all defects in a memory can be successfully repaired by a two-dimensional redundancy design. Unlike previous works, which rely on a timeconsuming simulation to estimate the expected yield, our yieldestimation scheme only requires scalable mathematical computation and can achieve a high accuracy with limited time and space complexity. Also, the proposed estimation scheme can consider the impact of single defects, column defects, and row defects simultaneously. With the help of the proposed yield-estimation scheme, we can effectively identify the most profitable redundancy configuration for large memory designs within few seconds while it may take several hours or even days by using conventional simulation approach.

Original languageEnglish
Title of host publication2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
Pages235-240
Number of pages6
DOIs
StatePublished - 1 Dec 2010
Event2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010 - San Jose, CA, United States
Duration: 7 Nov 201011 Nov 2010

Publication series

NameIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
ISSN (Print)1092-3152

Conference

Conference2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
CountryUnited States
CitySan Jose, CA
Period7/11/1011/11/10

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    Chao, C-T., Chin, C. Y., & Lin, C. W. (2010). Mathematical yield estimation for two-dimensional-redundancy memory arrays. In 2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010 (pp. 235-240). [5654154] (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD). https://doi.org/10.1109/ICCAD.2010.5654154