Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics

Jaegoo Lee*, Judy J. Cha, Sara C. Barron, David A. Muller, R. Bruce Van Dover, Ebenezer K. Amponsah, Tuo-Hung Hou, Hassan Raza, Edwin C. Kan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations
Original languageEnglish
Title of host publication2008 IEEE International SOI Conference Proceedings
Pages39-40
Number of pages2
DOIs
StatePublished - 24 Dec 2008
Event2008 IEEE International SOI Conference - New Paltz, NY, United States
Duration: 6 Oct 20089 Oct 2008

Publication series

NameProceedings - IEEE International SOI Conference
ISSN (Print)1078-621X

Conference

Conference2008 IEEE International SOI Conference
CountryUnited States
CityNew Paltz, NY
Period6/10/089/10/08

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