Magnetoresistance and magnetic force microscopy studies in Ni80Fe20 disk- and ring-patterned wires

J. L. Tsai*, Y. D. Yao, B. S. Han, S. F. Lee, C. Yu, T. Y. Chen, E-Wen Huang, D. J. Zheng

*Corresponding author for this work

Research output: Contribution to journalArticle

2 Scopus citations

Abstract

The magnetization reversal process of the ring-, center dot ring-, and dot-patterned wires was discussed. It was found that a domain wall can be pinned by the center dot and the saturation and switching field were lagging. The results showed that the disk-patterned wire had the largest magnetoresistance (MR) ratio while the center dot ring-patterned wire had the smallest MR ratio.

Original languageEnglish
Pages (from-to)8424-8426
Number of pages3
JournalJournal of Applied Physics
Volume93
Issue number10 3
DOIs
StatePublished - 15 May 2003

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    Tsai, J. L., Yao, Y. D., Han, B. S., Lee, S. F., Yu, C., Chen, T. Y., Huang, E-W., & Zheng, D. J. (2003). Magnetoresistance and magnetic force microscopy studies in Ni80Fe20 disk- and ring-patterned wires. Journal of Applied Physics, 93(10 3), 8424-8426. https://doi.org/10.1063/1.1558673