Low-noise metamorphic HEMTs with reflowed 0.1-μm T-gate

Y. C. Lien*, Edward Yi Chang, H. C. Chang, L. H. Chu, G. W. Huang, H. M. Lee, C. S. Lee, S. H. Chen, P. T. Shen, C. Y. Chang

*Corresponding author for this work

Research output: Contribution to journalLetterpeer-review

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Chemical Compounds

Engineering & Materials Science