A linear optimal test generation algorithm is proposed to decompose serial test vectors into segments with one for each driver. Each driver is assigned a serial vector with two or more transitions for the detection of net and driver faults. As compared to the conventional counting and transition sequences, the reduction is up to 20% for buses and 36% for general networks.
|Number of pages||6|
|Journal||IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers|
|State||Published - 1 Dec 1998|
|Event||Proceedings of the 1998 IEEE/ACM International Conference on Computer-Aided Design, ICCAD - San Jose, CA, USA|
Duration: 8 Nov 1998 → 12 Nov 1998