Linear optimal test generation algorithm for interconnect testing

Chau-Chin Su*

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

A linear optimal test generation algorithm is proposed to decompose serial test vectors into segments with one for each driver. Each driver is assigned a serial vector with two or more transitions for the detection of net and driver faults. As compared to the conventional counting and transition sequences, the reduction is up to 20% for buses and 36% for general networks.

Original languageEnglish
Pages (from-to)290-295
Number of pages6
JournalIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
DOIs
StatePublished - 1 Dec 1998
EventProceedings of the 1998 IEEE/ACM International Conference on Computer-Aided Design, ICCAD - San Jose, CA, USA
Duration: 8 Nov 199812 Nov 1998

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