Lifetime Reliability Trojan Based on Exploring Malicious Aging

Tien Hung Tseng, Shou Chun Li, Kai-Chiang Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Due to escalating complexity of hardware design and manufacturing, integrated circuits (ICs) are designed and fabricated in multiple nations, so are software tools. It makes hardware security become more subject to various kinds of tampering in the supply chain. Hardware Trojan horses (HTHs) can be implanted to facilitate the leakage of confidential information or cause the failure of a system. Reliability Trojan is one of the main categories of HTH attacks because its behavior is progressive and thus hard to be detected, or not considered malicious. In this work, we propose to insert reliability Trojan into a circuit which can finely control the circuit lifetime as specified by attackers (or even designers), based on manipulating BTI-induced aging behavior in a statistical manner, with the consideration of process variations (PVs). Experimental results show that, given a specified lifetime target and under the influence of PVs, the circuit is highly likely to fail within a desired lifetime interval, at the cost of little area overhead.

Original languageEnglish
Title of host publicationProceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018
PublisherIEEE Computer Society
Pages74-79
Number of pages6
ISBN (Electronic)9781538694664
DOIs
StatePublished - 6 Dec 2018
Event27th IEEE Asian Test Symposium, ATS 2018 - Hefei, China
Duration: 15 Oct 201818 Oct 2018

Publication series

NameProceedings of the Asian Test Symposium
Volume2018-October
ISSN (Print)1081-7735

Conference

Conference27th IEEE Asian Test Symposium, ATS 2018
CountryChina
CityHefei
Period15/10/1818/10/18

Keywords

  • aging
  • duty cycle
  • lifetime trojan
  • timing violation

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