Lifetime-aware LRU promotion policy for last-level cache

Hong Yi Wu, Chien Chih Chen, Hsiang Jen Tsai, Yin Chi Peng, Tien-Fu Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The traditional LRU replacement policy is susceptible to memory-intensive workloads with large non-reused data like thrashing applications and scan applications. For such workloads, the majority of cache blocks don't get any cache hits during residing in the cache. Cache performance can be improved by reducing the interference from non-reused data. Therefore, the lifetime of other blocks is increased and it can contribute to cache hit. We propose a Lifetime-aware LRU Promotion Policy and show that changing the promotion policy can effective reduce cache miss in the last-level cache. Our promotion policy dynamically adjusts promotion strategy and increases the lifetime for useful cache blocks. The experimental results show that our proposal reduces the average MPKI by 6% and 9% over EAF and DIP, respectively. In multicore, we also improve the performance and reduce the MPKI.

Original languageEnglish
Title of host publication2015 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479962754
DOIs
StatePublished - 28 May 2015
Event2015 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2015 - Hsinchu, Taiwan
Duration: 27 Apr 201529 Apr 2015

Publication series

Name2015 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2015

Conference

Conference2015 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2015
CountryTaiwan
CityHsinchu
Period27/04/1529/04/15

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  • Cite this

    Wu, H. Y., Chen, C. C., Tsai, H. J., Peng, Y. C., & Chen, T-F. (2015). Lifetime-aware LRU promotion policy for last-level cache. In 2015 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2015 [7114579] (2015 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/VLSI-DAT.2015.7114579