Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers

M. Schulz-Ruhtenberg*, T. Ackemann, Kai-Feng Huang, I. Babushkin, N. Loiko

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2005 European Quantum Electronics Conference, EQEC '05
Number of pages1
DOIs
StatePublished - 1 Dec 2005
Event2005 European Quantum Electronics Conference, EQEC '05 - Munich, Germany
Duration: 12 Jun 200517 Jun 2005

Publication series

Name2005 European Quantum Electronics Conference, EQEC '05
Volume2005

Conference

Conference2005 European Quantum Electronics Conference, EQEC '05
CountryGermany
CityMunich
Period12/06/0517/06/05

Cite this

Schulz-Ruhtenberg, M., Ackemann, T., Huang, K-F., Babushkin, I., & Loiko, N. (2005). Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers. In 2005 European Quantum Electronics Conference, EQEC '05 [1567321] (2005 European Quantum Electronics Conference, EQEC '05; Vol. 2005). https://doi.org/10.1109/EQEC.2005.1567321