Latehup-like failure of power-rail ESD clamp circuits in CMOS integrated circuits under system-level ESD test

Ming-Dou Ker*, Cheng Cheng Yen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint Dive into the research topics of 'Latehup-like failure of power-rail ESD clamp circuits in CMOS integrated circuits under system-level ESD test'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science