Laser parameter extraction for tunable vertical cavity lasers

Chien-Chung Lin*, F. Sugihwo, J. S. Harris

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations


A novel technique for extraction of diode laser parameters is demonstrated. With tunable vertical cavity surface emitting lasers (VCSELs), the internal quantum efficiency, internal loss, average gain coefficient, and transparent current density can be extracted on the same device. This technique enables evaluation of critical elements and design of VCSEL structures.

Original languageEnglish
Pages (from-to)1705-1707
Number of pages3
JournalElectronics Letters
Issue number20
StatePublished - 25 Sep 1997


  • Laser variable measurement
  • Vertical cavity surface emitting lasers

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