Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits

Yi-Ming Li*, Chih Hong Hwang, Ta Ching Yeh, Tien Yen Li

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

14 Scopus citations

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Engineering & Materials Science