Large electro-optic coefficient observed in ion-exchanged potassium titanyl phosphate waveguides

Yi Chiu*, Daniel D. Stancil, Tuviah E. Schlesinger

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the observation of an anomalously large electro-optic coefficient in potassium titanyl phosphate (KTiOPO 4, KTP) waveguides fabricated under various conditions. An interferometric method was used to measure the effective electro-optic coefficient r 33 in the waveguides by measuring the phase retardation of an optical mode when a voltage is applied across the substrate. We observe that at low frequency the waveguide electro-optic coefficient can be higher than the bulk value by a factor up to about 100. Since KTP crystals are known to have a high concentration of mobile ions, a model relating the mobile charges, space charge fields, and observed enhancement in r 33 is proposed to explain the mechanism of this effect. Possible device application and long term effects on system operation are also discussed.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
EditorsMool C. Gupta, William J. Kozlovsky, David C. MacPherson
Pages164-169
Number of pages6
DOIs
StatePublished - 1 Jan 1996
EventNonlinear Frequency Generation and Conversion - San Jose, CA, USA
Duration: 29 Jan 199631 Jan 1996

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume2700

Conference

ConferenceNonlinear Frequency Generation and Conversion
CitySan Jose, CA, USA
Period29/01/9631/01/96

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    Chiu, Y., Stancil, D. D., & Schlesinger, T. E. (1996). Large electro-optic coefficient observed in ion-exchanged potassium titanyl phosphate waveguides. In M. C. Gupta, W. J. Kozlovsky, & D. C. MacPherson (Eds.), Proceedings of SPIE - The International Society for Optical Engineering (pp. 164-169). (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 2700). https://doi.org/10.1117/12.239648