Abstract
We report the implementation of ion-cut silicon-on-insulator (SOI) water fabrication technique with plasma immersion ion implantation (PIII). The hydrogen implantation rate, which is independent of the wafer size, is considerably higher than that of conventional implantation. The simple PIII reactor setup and its compatibility with cluster-tools offer other ion-cut process optimization opportunities. The feasibility of the PIII ion-cut process is demonstrated by successful fabrication of SOI structures. The hydrogen plasma can be optimized so that only one ion species is dominant. The feasibility of performing ion-cut using helium PIII is also demonstrated.
Original language | English |
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Pages (from-to) | 2767-2769 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 71 |
Issue number | 19 |
DOIs | |
State | Published - 10 Nov 1997 |