Investigation on the robustness, accuracy and simulation performance of a physics-based deep-submicrometer BSIM model for analog/digital circuit simulation

Yuhua Cheng*, Min Chie Jeng, Zhihong Liu, Kai Chen, Mansun Chan, Chen-Ming Hu, Ping Keung Ko

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

5 Scopus citations

Abstract

We present an accurate and unified MOSFET model with benchmark test results for analog/digital circuit simulation. The results show that the model can pass most benchmarks suggested for a model used in circuit simulation by SEMATECH recently, and ensures good scalability and accuracy. The model has been implemented in Hspice, Spectre, SmartSpice and Spice3e2.

Original languageEnglish
Pages (from-to)321-324
Number of pages4
JournalProceedings of the Custom Integrated Circuits Conference
StatePublished - 1 Jan 1996
EventProceedings of the 1996 IEEE Custom Integrated Circuits Conference - San Diego, CA, USA
Duration: 5 May 19968 May 1996

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