Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique

Ta-Hui Wang*, Tse En Chang, Lu Ping Chiang, Chih Hung Wang, Nian Kai Zous, Chimoon Huang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

49 Scopus citations

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Chemical Compounds

Engineering & Materials Science