Investigation of omnidirectional reflection band in ZnTe/ZnSe distributed Bragg reflector

Ying Shin Huang, Sheng Yao Hu, Yueh Chien Lee*, Chung Cheng Chang, Kwong Kau Tiong, Ji Lin Shen, Wu-Ching Chou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

We report the characteristics of reflectance spectra of the 15- and 20-period ZnTe/ZnSe distributed Bragg reflector grown on GaAs (001) substrates by molecular beam epitaxy. The reflectance spectra measured at various incident angles and polarizations were investigated by the theoretical curves simulated using transfer matrix method. The wavelength variation of the refractive indices described by Sellmeier equation and random thickness model were also considered for the interpretation of the experimentally observed curves. An omnidirectional reflection range defined from the edge of incident-angle-dependent reflection band with TE and TM polarizations is about 15 nm, and is consistent with the observed experimental curves. The results showed that the selected ZnTe and ZnSe materials are suitable for constructing multilayer structures having omnidirectional reflection band.

Original languageEnglish
Pages (from-to)755-759
Number of pages5
JournalJournal of Alloys and Compounds
Volume649
DOIs
StatePublished - 1 Aug 2015

Keywords

  • Distributed Bragg reflectors
  • Molecular beam epitaxy
  • Reflectance
  • ZnSe
  • ZnTe

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