Investigation of degradation of single-cell PV module by pressure cooker test and damp heat test

Chao Ming Tung, Yu Tai Li, Wei Lun Yang, Hung Sen Wu, Peichen Yu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Accelerated methods for evaluating thermo humidity resistance of single-cell PV module are demonstrated with standard damp heat test (DH) and non-standard pressure cooker test (PCT). We investigated the failure mechanism of PCT. Our result shows testing under PCT more than 121 °C has fast degradation compared to other condition.

Original languageEnglish
Title of host publication2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages935-937
Number of pages3
ISBN (Electronic)9781509027248
DOIs
StatePublished - 18 Nov 2016
Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
Duration: 5 Jun 201610 Jun 2016

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2016-November
ISSN (Print)0160-8371

Conference

Conference43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
CountryUnited States
CityPortland
Period5/06/1610/06/16

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