Investigation of degradation of single-cell PV module by pressure cooker test and damp heat test

Chao Ming Tung, Yu Tai Li, Wei Lun Yang, Hung Sen Wu, Peichen Yu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Accelerated methods for evaluating thermo humidity resistance of single-cell PV module are demonstrated with standard damp heat test (DH) and non-standard pressure cooker test (PCT). We investigated the failure mechanism of PCT. Our result shows testing under PCT more than 121 °C has fast degradation compared to other condition.

Original languageEnglish
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-3
Number of pages3
ISBN (Electronic)9781509056057
DOIs
StatePublished - 1 Jan 2017
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: 25 Jun 201730 Jun 2017

Publication series

Name2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Conference

Conference44th IEEE Photovoltaic Specialist Conference, PVSC 2017
CountryUnited States
CityWashington
Period25/06/1730/06/17

Fingerprint Dive into the research topics of 'Investigation of degradation of single-cell PV module by pressure cooker test and damp heat test'. Together they form a unique fingerprint.

  • Cite this

    Tung, C. M., Li, Y. T., Yang, W. L., Wu, H. S., & Yu, P. (2017). Investigation of degradation of single-cell PV module by pressure cooker test and damp heat test. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1-3). (2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366158