Investigation of Cu 0.5Ni 0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

S. Y. Huang, J. J. Liang, Shih-Ying Hsu, L. K. Lin, T. C. Tsai, S. F. Lee

Research output: Contribution to journalArticlepeer-review

2 Scopus citations


A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu 0.5Ni 0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.

Original languageEnglish
Pages (from-to)153-162
Number of pages10
JournalEuropean Physical Journal B
Issue number2
StatePublished - 1 Jan 2011

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