Intrinsic parameter fluctuations on current mirror circuit with different aspect ratio of 16-nm Multi-Gate MOSFET

Hui Wen Cheng, Chun Yen Yiu, Thet Thet Khaing, Yiming Li*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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Engineering & Materials Science