Interfacial structure

R. Aburano, Hawoong Hong, K. Chung, M. Nelson, P. Zschack, Haydn Chen, T. Chiang

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

A room-temperature-deposited (Formula presented) film on a Ge(100)-(2×1) surface retains the clean-surface (2×1) dimers at the interface. This is revealed by Patterson analysis of synchrotron x-ray-diffraction measurements of numerous in-plane fractional-order diffraction spots. The result suggests a mild interaction between the room-temperature-deposited film and the substrate surface reconstruction. The (Formula presented) film shows a (111) growth direction, and its (Formula presented) azimuth is oriented parallel to the (062)\ directions of the substrate. The result is a domain structure consistent with the threefold symmetry of the (111) growth direction and the two-domain, twofold symmetry of the substrate surface.

Original languageEnglish
Pages (from-to)6636-6641
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume57
Issue number11
DOIs
StatePublished - 1 Jan 1998

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    Aburano, R., Hong, H., Chung, K., Nelson, M., Zschack, P., Chen, H., & Chiang, T. (1998). Interfacial structure. Physical Review B - Condensed Matter and Materials Physics, 57(11), 6636-6641. https://doi.org/10.1103/PhysRevB.57.6636