Interface resistance and transparency in ferromagnet/superconductor Co Nbx Ti1-x multilayers (x=1, 0.6, and 0.4)

S. Y. Huang, S. F. Lee*, Shih-ying Hsu, Y. D. Yao

*Corresponding author for this work

Research output: Contribution to journalArticle

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Abstract

The quantitative interface resistance between polycrystalline ferromagnetic Co and Nbx Ti1-x, with x=1, 0.6, and 0.4, is measured and analyzed at 4.2 K. Both the superconducting and normal states of Nbx Ti1-x, respectively, above and below the superconducting critical thickness, are studied with current flowing perpendicular to the interface. A one-band series-resistance model is used to analyze our data. The interface transparencies in terms of the ratio between interface resistance and various physical quantities are discussed.

Original languageEnglish
Article number024521
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume76
Issue number2
DOIs
StatePublished - 30 Jul 2007

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