Interface Polarization Fluctuation Effect of Ferroelectric Hafnium-Zirconium-Oxide Ferroelectric Memory with Nearly Ideal Subthreshold Slope

Yu Chien Chiu, Chun-Hu Cheng, Chia Chi Fan, Po-Chun Chen, Chun-Yen Chang, Min Hung Lee, Chien Liu, Shiang Shiou Yen, Hsiao-Hsuan Hsu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publication2015 73rd Annual Device Research Conference (DRC)
StatePublished - 2015

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