Interface effects on the magnetoelectric properties of (0 0 l)-oriented Pb(Zr0.5Ti0.5)O3/CoFe2O4 multilayer thin films

Rueijer Lin, Tai bor Wu*, Ying-hao Chu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

33 Scopus citations

Abstract

(0 0 l)-oriented Pb(Zr0.5Ti0.5)O3/CoFe2O4 (PZT/CFO) multilayer thin films were fabricated with a change in stacking periodicity. When the periodicity increased, a size effect on both ferroelectric and ferromagnetic properties was observed. This result indicates the existence of a passive layer at the PZT/CFO interface. Consequently, the magnetoelectric coupling was significantly degraded with increasing stacking periodicity. From transmission electron microscopy analysis, in addition to slight interdifussion, a highly roughened interface structure is believed to be responsible for the formation of the passive layer.

Original languageEnglish
Pages (from-to)897-900
Number of pages4
JournalScripta Materialia
Volume59
Issue number8
DOIs
StatePublished - 1 Oct 2008

Keywords

  • Magnetoelectric voltage coefficient
  • Multiferroic films
  • Multilayers

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