Innovative methodologies of circuit edit by focused ion beam (FIB) on wafer-level chip-scale-package (WLCSP) devices

Tao Chi Liu, Chih Chen*, Shih Ting Liu, Ming Lun Chang, Jandel Lin

*Corresponding author for this work

Research output: Contribution to journalReview article

1 Scopus citations

Abstract

As packaging technology advances to wafer level chip scale packaging (WLCSP) to enable reduced chip size and manufacturing cost, circuit edit has become a critical issue for the fully packaged integrated circuits (ICs). These advanced package types cannot be rebuilt on a single chip; therefore, function testing after circuit edit of WLCSP faces challenges. Furthermore, there are routings at the redistribution layer of WLCSP ICs. Circuit edit was applied on both the chip and the package level. In this paper the focused ion beam was applied to mill the organic material of the package structure to expose underlying ICs, instead of chemically destroying the packaging. Metal line cutting and conductive path deposition were also developed by a beam-based technique. These new approaches make the direct edit of electrical circuitry possible not only in ICs but also at package level. Therefore, for the debug process and for failure analysis, the WLCSP ICs have negligible damage and negligible signal integrity loss by retaining the original packaging structure.

Original languageEnglish
Pages (from-to)1536-1541
Number of pages6
JournalJournal of Materials Science: Materials in Electronics
Volume22
Issue number10
DOIs
StatePublished - 1 Oct 2011

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