Influence on light-induced degradation in Cz-Si PERC cells under light soaking of variant wavelength and intensity

Ching Wen Wu, Yen Chun Lee, Li Chieh Yu, Min An Tsai, Hung Sen Wu, C. W. Kuo, T. M. Kuan, C. Y. Yu, Pei-Chen Yu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We have carried out multiple analysis on the acceleration factors of LID for Cz-Si PERC cells, including temperatures, intensities and wavelengths at 396nmand 969nm. The recovery time of LID at 130 ° C under 1 SUN shrinks down to 4 hrs and the maximum degradation in Pmax is less than 3 % due the elimination of B-O LID under high carrier-injection. However, it seems that higher intensities couldn't stop the second degradation from happening, indicating the formation of other defects. Therefore, we employ LED light source of different wavelengths and obtain that both maximum degradation of Pmax are quite different. The consequence implies that behavior of LID might be originated from the particular position (penetration depth) where carriers are located.

Original languageEnglish
Title of host publication2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1361-1363
Number of pages3
ISBN (Electronic)9781538685297
DOIs
StatePublished - 26 Nov 2018
Event7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States
Duration: 10 Jun 201815 Jun 2018

Publication series

Name2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC

Conference

Conference7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
CountryUnited States
CityWaikoloa Village
Period10/06/1815/06/18

Keywords

  • Cz-Si LID
  • LED illumination
  • acceleration
  • wavelength

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