In situ TEM and energy dispersion spectrometer analysis of chemical composition change in ZnO nanowire resistive memories

Yu Ting Huang, Shih Ying Yu, Cheng Lun Hsin, Chun Wei Huang, Chen Fang Kang, Fu Hsuan Chu, Jui Yuan Chen, Jung Chih Hu, Lien Tai Chen, Jr Hau He, Wen-Wei Wu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

30 Scopus citations

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Chemical Compounds