In this paper, a functional fault model for analog circuit diagnosis is proposed. A faulty module is modeled as a fault-free module in serial or in parallel with a fault module. To extract such a fault module, we adopt an iterative deconvolution technique to deconvolute the impulse response of the fault module from the faulty response. The test results show that with such a fault model and fault extraction technique the diagnostic resolution is improved significantly due to the separation of the fault and the system function. Moreover, such a fault model allows single-module fault tables to be applied to the diagnosis of a multi-module system.
|Number of pages||6|
|Journal||IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers|
|State||Published - 1 Dec 1995|
|Event||Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA|
Duration: 5 Nov 1995 → 9 Nov 1995