Impulse response fault model and fault extraction for functional level analog circuit diagnosis

Chau-Chin Su*, Shenshung Chiang, Shyh-Jye Jou

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

5 Scopus citations

Abstract

In this paper, a functional fault model for analog circuit diagnosis is proposed. A faulty module is modeled as a fault-free module in serial or in parallel with a fault module. To extract such a fault module, we adopt an iterative deconvolution technique to deconvolute the impulse response of the fault module from the faulty response. The test results show that with such a fault model and fault extraction technique the diagnostic resolution is improved significantly due to the separation of the fault and the system function. Moreover, such a fault model allows single-module fault tables to be applied to the diagnosis of a multi-module system.

Original languageEnglish
Pages (from-to)631-636
Number of pages6
JournalIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
DOIs
StatePublished - 1 Dec 1995
EventProceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA
Duration: 5 Nov 19959 Nov 1995

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