Improvements in the reliability of a-InGaZnO thin-film transistors with triple stacked gate insulator in flexible electronics applications

Hua Mao Chen, Ting Chang Chang*, Ya-Hsiang Tai, Kuan Fu Chen, Hsiao Cheng Chiang, Kuan Hsien Liu, Chao Kuei Lee, Wei Ting Lin, Chun Cheng Cheng, Chun Hao Tu, Chu Yu Liu

*Corresponding author for this work

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