Improved hot carrier reliability in strained-channel NMOSFETS with TEOS buffer layer

Ching Sen Lu*, Horng-Chih Lin, Yao Jen Lee, Tiao Yuau Huang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations
Original languageEnglish
Title of host publication2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual
Pages670-671
Number of pages2
DOIs
StatePublished - 25 Sep 2007
Event45th Annual IEEE International Reliability Physics Symposium 2007, IRPS - Phoenix, AZ, United States
Duration: 15 Apr 200719 Apr 2007

Publication series

NameAnnual Proceedings - Reliability Physics (Symposium)
ISSN (Print)0099-9512

Conference

Conference45th Annual IEEE International Reliability Physics Symposium 2007, IRPS
CountryUnited States
CityPhoenix, AZ
Period15/04/0719/04/07

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