Improved Electrical Characteristics and Reliability of Multi-Stacking PNPN Junctionless Transistors Using Channel Depletion Effect

Ming Huei Lin, Yi-Jia Shih, Chien Liu, Yu Chien Chiu, Chia Chi Fan, Guan Lin Liou, Chun-Hu Cheng, Chun-Yen Chang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publicationSilicon Nanoelectronics Workshop (SNW)
Pages47-48
Number of pages2
DOIs
StatePublished - 2017

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