Impacts of NBTI and PBTI on power-gated SRAM with high-k metal-gate devices

Hao I. Yang*, Ching Te Chuang, Wei Hwang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Fingerprint Dive into the research topics of 'Impacts of NBTI and PBTI on power-gated SRAM with high-k metal-gate devices'. Together they form a unique fingerprint.

Engineering & Materials Science