Impact of on-chip interconnect frequency-dependent R(f)L(f) on digital and RF design

Yu Cao, Xuejue Huang, Dennis Sylvester, Tsu Jae King, Chen-Ming Hu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

17 Scopus citations

Abstract

On-chip interconnect exhibits clear frequency-dependence in both resistance and inductance. A compact ladder circuit model is developed to capture this behavior, and we examine its impact on digital and RF circuit design. It is demonstrated that the use of DC values for R and L is sufficient for delay analysis, but RL frequency dependence is critical for the analysis of signal integrity, shield line insertion, power supply stability, and RF inductor performance.

Original languageEnglish
Title of host publicationProceedings - 15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002
EditorsJohn Chickanosky, Ram K. Krishnamurthy, P.R. Mukund
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages438-442
Number of pages5
ISBN (Electronic)0780374940
DOIs
StatePublished - 1 Jan 2002
Event15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002 - Rochester, United States
Duration: 25 Sep 200228 Sep 2002

Publication series

NameProceedings of the Annual IEEE International ASIC Conference and Exhibit
Volume2002-January
ISSN (Print)1063-0988

Conference

Conference15th Annual IEEE International ASIC/SOC Conference, ASIC/SOC 2002
CountryUnited States
CityRochester
Period25/09/0228/09/02

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