Impact of Nanoscale Polarization Relaxation on Endurance Reliability of One-Transistor Hybrid Memory Using Combined Storage Mechanisms

Yu Chien Chiu, Chun-Yen Chang, Hsiao-Hsuan Hsu, Chun-Hu Cheng, Min Hung Lee

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

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