Impact of channel dangling bonds on reliability characteristics of Flash memory on poly-Si thin films

Yu Hsien Lin*, Chao-Hsin Chien, Tung Huan Chou, Tien-Sheng Chao, Tan Fu Lei

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Fingerprint Dive into the research topics of 'Impact of channel dangling bonds on reliability characteristics of Flash memory on poly-Si thin films'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science