Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

Cheng Hung Chu, Bau Jung Wu, Tsung-Sheng Kao, Yuan Hsing Fu, Hai Pang Chiang, Din Ping Tsai

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.

Original languageEnglish
Article number4815988
Pages (from-to)2221-2223
Number of pages3
JournalIEEE Transactions on Magnetics
Volume45
Issue number5
DOIs
StatePublished - 1 May 2009

Keywords

  • Conductive-atomic force microscopy (C-AFM)
  • Jitter
  • Recording mark
  • Writing strategy

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