IIIB-2 Channel Length Characterization of LDD MOSFET's-

Jack Y.C. Sun, Matthew R. Wordeman, Steven E. Laux

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)2536-2537
Number of pages2
JournalIEEE Transactions on Electron Devices
Volume32
Issue number11
DOIs
StatePublished - Nov 1985

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