IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons

Jack Y.C. Sun, Matthew R. Wordeman

Research output: Contribution to journalArticlepeer-review

8 Scopus citations
Original languageEnglish
Pages (from-to)1970
Number of pages1
JournalIEEE Transactions on Electron Devices
Volume31
Issue number12
DOIs
StatePublished - Dec 1984

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