IEEE standard 1500 compatible oscillation ring test methodology for interconnect delay and crosstalk detection

Katherine Shu Min Li*, Chung Len Lee, Chau-Chin Su, Jwu E. Chen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

A novel oscillation ring (OR) test scheme and architecture for testing interconnects in SOC is proposed and demonstrated. In addition to stuck-at and open faults, this scheme can also detect delay faults and crosstalk glitches, which are otherwise very difficult to be tested under the traditional test schemes. IEEE Std. 1500 wrapper cells are modified to accommodate the test scheme. An efficient algorithm is proposed to construct ORs for SOC based on a graph model. Experimental results on MCNC benchmark circuits have been included to show the effectiveness of the algorithm. In all experiments, the scheme achieves 100% fault coverage with a small number of tests.

Original languageEnglish
Pages (from-to)341-355
Number of pages15
JournalJournal of Electronic Testing: Theory and Applications (JETTA)
Volume23
Issue number4
DOIs
StatePublished - 1 Aug 2007

Keywords

  • Crosstalk glitches
  • Delay faults
  • IEEE P1500
  • Interconnect test
  • Open faults
  • Oscillation ring (OR) test scheme
  • SOC testing
  • Stuck-at faults
  • Wrapper cell design

Fingerprint Dive into the research topics of 'IEEE standard 1500 compatible oscillation ring test methodology for interconnect delay and crosstalk detection'. Together they form a unique fingerprint.

Cite this