Identification of fault types for single faults in bitonic sorters

Tsern-Huei Lee*, Jin Jye Chou

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Abstract

In a previous paper, we presented a procedure for detecting and locating single solid logical faults in bitonic sorters. We showed that it takes at most four tests to detect a single fault and most faults need only two tests to be detected. In this paper we present a procedure for identifying the fault type, assuming the faulty component has been located. In general, in order to identify the fault type, one needs to know whether the faulty sorting element is an up sorting element or a down sorting element as well as the values of erroneous and unidentified outputs. For some sorting element faults, an additional test is required to identify the fault types.

Original languageEnglish
Pages516-522
Number of pages7
StatePublished - 1 Jan 1995
EventProceedings of the 1995 IEEE International Conference on Communications. Part 1 (of 3) - Seattle, WA, USA
Duration: 18 Jun 199522 Jun 1995

Conference

ConferenceProceedings of the 1995 IEEE International Conference on Communications. Part 1 (of 3)
CitySeattle, WA, USA
Period18/06/9522/06/95

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